Brief Introduction of TE2890X Sine Wave Dynamic Test System

One. System brief

The TE2890X sine wave dynamic test system is a set of multifunctional capacitance test equipment integrating capacitance loss test and sine wave dynamic test. The sine wave dynamic test system detects the maximum current that the capacitor can withstand when the capacitor is applied with sine wave voltage at each specific frequency when the surface temperature rise of the capacitor reaches the predetermined value when the measured capacitance and the required test frequency cooperate with the corresponding inductance to reach resonance, the test voltage, test frequency and test time can be set to carry out the capacitance pulse test in accordance with the national standard of capacitance. During the test, the surface temperature rise of the measured capacitor shall be detected in real time, the capacity and loss of the measured capacitor shall be automatically and regularly detected and relevant data shall be recorded. At the same time, if the capacity and loss of the measured capacitor are out of tolerance or exceed the set current, the test shall be interrupted at any time and the test data shall be recorded and the test report shall be given..

The system is equipped with capacitance tester, oven, capacitor surface temperature sensor, oscilloscope, current amplifier, computer. Test data and voltage and current waveforms can be displayed by the computer and automatically generate tables.

II. System function description

1. Capacitance capacity test

Test capacitor capacity, loss and other parameters

2. Test of the current value of the capacitor

Using a high-voltage, high-current frequency wave power supply, the maximum current that the capacitor can withstand when the surface temperature rise of the capacitor reaches a predetermined value at each specific frequency when a sine wave voltage is applied to the capacitor is detected. The waveform on the capacitor is detected by the oscilloscope, and the value is analyzed and calculated by the computer system, and the corresponding waveform is printed out.

3. Real-time detection of surface temperature rise of measured capacitor

During the test, the surface temperature rise of the measured capacitor is detected in real time, the capacity and loss of the measured capacitor are detected automatically and regularly, and the relevant data are recorded.

Technical indicators:

Peak-to-Peak Voltage: Vp-p:1000V

Test frequency: 15.75K, 21K, 31K, 37K, 48K, 56K, 64K,

78K, 82K, 96K (subject to actual commissioning resonant frequency)

Peak-to-Peak Current: Ip-p:20A

Test method: the measured capacitance and inductance resonance to produce sine wave

Test capacity range 1nF --- 2uF

Real-time temperature detection: 0~100 degrees

Voltage waveform on the measured capacitor

Current waveform on the measured capacitor