TE2891 DV/DT Test System Introduction

One. System brief

TE2891 DV/DT test system is a set of multifunctional capacitor test equipment integrating capacitor capacity loss test, DV/DT value test and charge and discharge test. Using high voltage and high current power supply and advanced data acquisition means, it can not only measure the DV/DT parameter value of capacitor, but also set the voltage, current, test frequency, test times, etc. of impulse discharge test according to the obtained DV/DT value, conduct capacitance pulse tests in accordance with national standards for capacitance. During the test, the surface temperature rise of the tested capacitor shall be detected in real time, the capacity and loss of the tested capacitor shall be automatically and regularly detected and relevant data shall be recorded. During the test, the test shall be interrupted at any time if the capacity and loss of the tested capacitor are out of tolerance or the DV/DT test is unqualified, and the test data shall be recorded and the test report shall be given.

II. System function description

1. Capacitance capacity test

Test capacitor capacity, loss and other parameters

2. Capacitor DV/DT value test

Using high-voltage, high-current and low-frequency square-wave power supply, due to the measurement of the voltage value of the capacitor rising in unit time is difficult to achieve (the power supply is required to be large, and the switching power and speed are difficult to achieve), we use the DV/DT value when the capacitor is discharged. The waveform on the capacitor is detected by the oscilloscope, and the value is analyzed and calculated by the computer system, and the corresponding charge and discharge waveform is printed out.

3. Capacitor high frequency impulse discharge test

According to relevant standards, the system will automatically perform the impulse discharge test after setting the test voltage, current, impulse discharge interval time (I. e. impulse discharge frequency) and impulse discharge times of the impulse discharge test. This test is used to detect the defects that may occur in the process of the metalized film capacitor element of the specimen. It is the main equipment for impact test of the metalized film capacitor element.

4. Real-time detection of the surface temperature rise of the measured capacitor, and real-time sampling of the surface temperature of the capacitor at certain time intervals during the test

 
Three. The system can record the relevant data in real time during or at the end of the test and give the test report (temperature rise of capacitor surface, capacitance and loss, DV/DT value)

 
Fourth, technical indicators:

Test voltage: DC 0~1000V

DV/DT test frequency: 10HZ(100nF ~ 5μf)

                  100HZ(1nF～100nF)

Charge and discharge test frequency: 0.5KHZ, 1KHZ, 5KHZ three

Charging resistance: 5Ω, 30Ω, 100 Ω, 300 Ω, 500Ω

Discharge resistance: 1Ω, 2Ω, 5Ω, 10Ω, 20Ω

Unqualified discrimination: less than 80% of the test voltage during the test pulse period, it will be automatically rejected after discharge.

Real-time temperature detection: 0~100 degrees

Working power supply: AC220V ± 10%, 50Hz ± 10%, maximum power consumption of about 1000W